Good News | Firstack "Intelligent Dynamic Testing Equipment for SiC Devices" Successfully Designated as Zhejiang Province’s First-of-Its-Kind Equipment
On January 11, 2024, Zhejiang Provincial Department of Economy and Information Technology released the “2023 List of Zhejiang’s First-of-Its-Kind Equipment”. Following intense competition among manufacturing enterprises across the province, Firstack intelligent dynamic testing equipment for SiC devices was successfully selected and recognized as one of Zhejiang’s first-of-its-kind equipment, thanks to the company’s strong R&D capabilities and product innovation.

Product Introduction
The Intelligent Dynamic Test System for SiC Devices is a power semiconductor dynamic parameter testing system developed by Firstack based on over a decade of experience in SiC MOSFET/IGBT applications. Having undergone three generations of product iterations—the ME100D, ME200D, and ME300D—it is dedicated to assisting customers with the development, testing, and validation of power semiconductors, as well as their application testing and validation.
The SiC Device Intelligent Dynamic Test System features high accuracy, high efficiency, and advanced intelligence, with a maximum test voltage of 6000V, a current capacity of 10,000A, and parasitic inductance of <10 nH.
Currently, this series of equipment has been deployed by enterprises, universities, and research institutions including State Grid, SAIC, FAW, BYD, Geely, NIO, Invt, CATL, Great Wall, Infineon, Mitsubishi, CRRC, Silan, TBEA, Zhejiang University, and Fudan University, and has received positive feedback from customers.
